# SDR USAA2012061400028

- Type: Service difficulty report (as reported; unverified)
- Difficulty date: June 13, 2012
- Submitted: June 14, 2012
- Operation: Air carrier
- Aircraft: [N910AW](https://openairdocs.org/aircraft/N910AW), registered now
- Make and model: Boeing 757-2G7
- Registry model: [Boeing 757-2G7](https://openairdocs.org/model/boeing-757-2g7) (OpenAirDocs)
- Aircraft serial: 24523
- Aircraft time: 80,938 hours, 27,648 cycles
- System (JASC): [2750 · Trailing Edge Flap Control System](https://openairdocs.org/jasc/2750)
- Part: Diode
- Part number: 057070001
- Condition: Failed
- Location: Fseu
- Component: Fseu, Boeing
- Component part number: 285N001140
- Stage of operation: AP
- How discovered: O
- Nature of condition: J
- Precautionary procedure: L
- FAA source: FAA Service Difficulty Reporting System (https://sdrs.faa.gov/)
- Page: https://openairdocs.org/sdr/USAA2012061400028

## Discrepancy

PHX - FLT 26  EN ROUTE OGG TO PHX.  FLAPS FAILED TO MOVE, TRAILING EDGE LIGHT ON, AND EICAS MSG TRAILING EDGE DISAGREE DISPLAYED.  FLAPS NORMAL ON ALTERNATE SYS.  THE FLIGHT PERFORMED A GO-AROUND TO RUN THE CHECKLIST.  ON THE SECOND APPROACH, THE FLIGHT LANDED WITHOUT FURTHER INCIDENT.  MAINTENANCE REPLACED THE FSEU, AND PERFORMED A VISUAL INSPECTION OF THE FLAP DIVE SYSTEM.  REPLACED TRANSISTOR Q38 (MPN H00212-2), DIODE ARRAY MICROCIRCUIT U92 (MPN 057070-001), AND DIODE ARRAY MICROCIRCUIT U94 (MPN 057070-001) ON A4 PCA DUE TO TEST FAILURES.  UNIT PASSED FINAL ACCEPTANCE TESTING.  RETURNED TO SERVICE.

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